Spacer Formation with Straight Sidewall

ABSTRACT

Disclosed herein is a semiconductor device comprising a first dielectric disposed over a channel region of a transistor formed in a substrate and a gate disposed over the first dielectric. The semiconductor device further includes a second dielectric disposed vertically, substantially perpendicular to the substrate, at an edge of the gate, and a spacer disposed proximate to the second dielectric. The spacer includes across-section with a perimeter that includes atop curved portion and a vertical portion substantially perpendicular to the substrate. The perimeter further includes a discontinuity at an interface of the top curved portion with the vertical portion. Further, disclosed herein are methods associated with the fabrication of the aforementioned semiconductor device.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.14/051,828, filed Oct. 11 2013, all of which is incorporated byreference herein in its entirety.

BACKGROUND OF THE INVENTION

Technical Field

The present disclosure relates to the fabrication of spacers. Morespecifically, the present disclosure relates to fabricating spacershaving vertical sidewalk and to improving spacer shape and spacer width.

Related Art

In integrated circuit fabrication technology, a spacer is a structuralfeature commonly formed proximate to a sidewall of a topographicalfeature. One function of the spacer may be to improve the electricalperformance of a device comprising the topographical feature. Anotherfunction of the spacer is to act as a mask during fabrication.

For example, in modern complementary metal oxide semiconductor (CMOS)processes, oxide or nitride spacers may be formed at the sidewalk of apolycrystalline silicon (poly-Si) transistor gate in order toelectrically isolate the gate from the transistor's source and drainterminals. Similarly, in modern bipolar junction transistor (BJT)technologies, in which the BJTs have self-aligned emitters, oxidespacers may be formed at an edge of a self-aligned emitter in order toisolate the emitter from the base electrode.

Further, spacers are used as ion implantation hard masks for achievingdouble-diffused structures in lightly doped drain/source metal oxidefield-effect transistors (LDD-MOSFETs). Spacers may also be used as hardmasks for transferring patterns in an underlying layer or substrate. Inthe latter application, the use of spacers enhances a conventionallithography process by allowing double the expected number of featuresto be transferred to the underlying layer or substrate in one exposurestep. Furthermore, in self-aligned suicide layer formation, spacers maybe used to prevent shorting the gate and source/drain terminals duringthe salicide process.

A spacer may also serve as an active terminal of a device. For example,in split-gate transistors, which are used in embedded charge trappingmemory devices, a poly-Si spacer may be used to form one of the twogates of a split-gate transistor memory cell. The poly-Si spacer gate istypically metallized and serves as a select gate for the memory cell.

There are several parameters to consider when fabricating spacers,especially when they are to be used in the applications mentioned above.Etch rate, etch chemistry, material deposition thickness, among otherparameters, may all affect the spacers' shape and width. Offsets inwidth or irregular sidewall profiles result from non-ideal fabricationconditions, which directly affect overall device performance.

For example, a split-gate transistor may have an undesired drivestrength or selection threshold if there is an offset in the selectiongate spacer's nominal width. Furthermore, a tapered or curved spacersidewall profile may result in shorting the gate and drain terminalsduring a salicide process. Also, in applications where spacers are usedfor pattern transfer, incorrect feature sizes and incorrect pitch valuesmay result from offsets in nominal spacer width and from tapered orcurved spacer sidewall profiles.

BRIEF SUMMARY OF THE INVENTION

Disclosed herein are structure and method embodiments comprising spacershaving highly vertical sidewalls and spacers which can be fabricatedwith improved process control.

One embodiment is directed to a semiconductor device comprising a firstdielectric disposed over a channel region of a transistor formed in asubstrate and a gate disposed over the first dielectric. Thesemiconductor device farther includes a second dielectric disposedvertically, substantially perpendicular to the substrate, at an edge ofthe gate, and a spacer disposed proximate to the second dielectric. Thespacer includes a cross-section with a perimeter that includes a topcurved portion and a vertical portion substantially perpendicular to thesubstrate. The perimeter further includes a discontinuity at aninterface of the top curved portion with the vertical portion.

Another embodiment is directed to a method of fabricating asemiconductor device. The method comprises disposing a gate structure ona substrate. The gate structure comprises a transistor gate, a firstdielectric disposed beneath the transistor gate, and a second dielectricat least on sidewalls of the gate and over the gate. The method furthercomprises disposing a first layer of material over the seconddielectric, disposing a second layer of material over the first layer ofmaterial, etching the second layer of material such that portions of thesecond layer of material remain on sidewalls of the first layer ofmaterial, and etching the first layer of material with an etchant havingsubstantially higher selectivity to the first layer of material than tothe second layer of material.

Yet another embodiment is directed to a method of fabricating asemiconductor device, comprising disposing a first dielectric on asubstrate, disposing a first gate layer over the first dielectric,etching the first gate layer to form a first transistor gate, andetching the first dielectric such that a portion of the first dielectricremains beneath the first transistor gate. The method further includesdisposing a second dielectric over the first transistor gate and overthe substrate, disposing a second gate layer over the second anddisposing a thin layer of material over the second gate layer, the thinlayer of material substantially thinner than the second gate layer.Furthermore, the method comprises etching the thin layer to leave of thethin layer on sidewalls of the second gate layer and forming, by etchingthrough the second gate layer, a second transistor gate comprising asidewall having a cross-section that includes a vertical portionsubstantially perpendicular to the substrate and a top curved portion.

Further features and advantages of the invention, as well as thestructure and operation of various embodiments of the invention, aredescribed in detail below with reference to the accompanying drawings.It is noted that the invention is not limited to the specificembodiments described herein. Such embodiments are presented herein forillustrative purposes only. Additional embodiments will be apparent topersons skilled in the relevant art(s) based on the teachings containedherein.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments of the invention will now be described, by way of exampleonly, with reference to the accompanying schematic drawings in whichcorresponding reference symbols indicate corresponding parts. Further,the accompanying drawings, which are incorporated herein and form partof the specification, illustrate embodiments of the present invention,and, together with the description, further serve to explain theprinciples of the invention and to enable a person skilled in therelevant art(s) to make and use the invention.

FIG. 1 is a cross-sectional view of a split-gate transistor comprising aspacer having a curved sidewall.

FIGS. 2A-2E illustrate various cross-sectional views of split-gatetransistors during an example fabrication process.

FIG. 3 shows a split-gate transistor, according to an exampleembodiment.

FIGS. 4A-4D illustrate various cross-sectional views of split-gatetransistors during fabrication, according to an example embodiment.

The features and advantages of embodiments of the present invention,will become more apparent from the detailed description set forth belowwhen taken in conjunction with the drawings. In the drawings, likereference numbers generally indicate identical or similar elements,unless otherwise mentioned. Additionally, generally, the left-mostdigit(s) of a reference number identifies the drawing in which thereference number first appears.

DETAILED DESCRIPTION OF THE INVENTION

This specification discloses one or more embodiments that incorporatefeatures of this invention. The disclosed embodiment(s) merely exemplifythe present invention. The scope of the present invention is not limitedto the disclosed embodiment(s).

The embodiment(s) described, and references in the specification to “oneembodiment,” “an embodiment,” “an example embodiment,” etc., indicatethat the embodiment(s) described may include a particular feature,structure, or characteristic, but every embodiment may not necessarilyinclude the particular feature, structure, or characteristic. Moreover,such phrases are riot necessarily referring to the same embodiment.Further, when a particular feature, structure, or characteristic isdescribed in connection with an embodiment, it is understood that it iswithin the knowledge of one skilled in the art to effect such feature,structure, or characteristic in connection with other embodimentswhether or not expressly described.

Before describing the various embodiments in detail, further explanationshall be given regarding certain terms that are used throughout thedescriptions.

The terms “etch” or “etching” or “etch-back process” are used herein togenerally describe a fabrication process of patterning a material suchthat at least a portion of the material remains after etching iscompleted. It shall be construed that etching a semiconductor material,for example, involves the steps of patterning a mask layer disposed overthe semiconductor material (e.g., a photoresist layer or a hard mask),subsequently removing areas of the semiconductor material that are nolonger protected by the mask layer, and optionally removing remainingportions of the mask layer. It shall also be construed that suchremoving step is conducted using an “etchant” and that such an etchanthas a “selectivity” that is higher to the semiconductor material than tothe mask layer. Further, it shall be understood that etching may be usedin general terms without a mask layer, yet still yielding removed partsand remaining parts of the etched material.

The term “selectivity” between two materials is described herein as theratio between the etch rates of the two materials under the same etchingconditions. For example, an etchant with a selectivity of 3:1 to thesemiconductor over the mask layer means that the etchant removes thesemiconductor material at a rate three times faster than that at whichit removes the mask layer.

The term “substrate” is used herein to generally describe a materialonto which subsequent material layers are added. In this disclosure, thesubstrate itself may be patterned and materials added on top of it mayalso be patterned or remain without patterning. Furthermore, althoughthroughout the following descriptions, the substrate is most commonlythought to be silicon, the substrate may also be any of a wide varietyof materials, including commonly used semiconductor materials.

Further, it shall be understood that devices fabricated in and/or on thesubstrate may be in several regions of the substrate and furthermorethat these regions may not be mutually exclusive. That is, in someembodiments, portions of one or more regions may overlap.

Further, the terms “deposit” or “dispose” are used herein to describethe act of applying a layer of material to the substrate or to layersalready applied to the substrate, whether these layers are patterned ornot. Further, it shall be understood that the deposited layer ofmaterial is conformal, unless otherwise mentioned. The term “conformal”is used herein to describe a film that at least partially covers one ormore sidewalls of features patterned on a substrate.

The term “substantially perpendicular,” in reference to a topographicalfeature's sidewall, is used herein to generally describe a sidewalldisposed at an angle ranging between about 85 degrees and 90 degreeswith respect to the substrate. The term “substantially shorter,” inreference to the length of a first feature relative to that of a secondfeature, is used herein to generally imply that the length of the firstfeature is at most one half the length of the second feature. Lastly,the term “substantially longer” is used herein, in reference to thelength of a first feature relative to that of a second feature, togenerally imply that the length of the first feature is a least twicethe length of the second feature.

Turning now to the drawings, FIG. 1 illustrates an example of anon-volatile memory cell 100 having a split-gate transistorarchitecture. Memory cell 100 is formed on substrate 102. For ease ofdescription, substrate 102 is assumed to be silicon. Other substratematerials may be used. Further, substrate 102 may be p-type silicon or ap-type well formed in an n-type silicon substrate or well. Memory cell100 includes a first n-type doped region 104 and a second n-type dopedregion 106. The first doped region 104 may be used as a source/drainregion, and similarly, the second doped region 106 may also be used as asource/drain region. While regions 104 and 106 are n-type in thisexample, they may also be p-type regions when substrate 102 is n-typesilicon or an n-type well formed in a p-type silicon substrate. Further,regions 104 and 106 may he formed, for example, using ion implantation.For convenience, region 104 is referred herein as the drain of memorycell 100, and region 106 is referred to as a the source of memory cell100, irrespective of biases applied thereto. The terms drain and sourceare used by convention, not as limitations.

Memory cell 100 includes two gates, a select gate 114 and a memory gate110. Each gate may be a poly-Si layer. As shall be described below,select gate 114 is a spacer. Select gate 114 is disposed over dielectriclayer 112, whereas memory gate 110 is disposed over a charge-trappingdielectric 108. The charge-trapping dielectric 108 may include, forexample, a charge-trapping silicon nitride layer sandwiched between twosilicon dioxide layers; this three-layer arrangement is referred to asan “oxide, nitride, oxide (ONO) stack,” or simply as “ONO layers.”Alternatively, charge-trapping dielectric 108 may include a silicon-richnitride film, or any film that includes, but is not limited to, silicon,oxygen, and nitrogen, in various stoichiometries.

Dielectric 112 electrically isolates select gate 114 from memory gate110. Dielectric 112 comprises a first portion that is disposedvertically, i.e., substantially perpendicular to substrate 102, and asecond portion disposed horizontally beneath select gate 114. The firstportion and the second portion are connected to one another, e.g.,dielectric 112 may be deposited in a single step to form its horizontaland vertical portions. In some examples, dielectric 112 and chargetrapping dielectric 108 may have the same architecture, e.g., they mayboth be ONO stacks, while in other examples they may be physicallydistinguishable. For example, dielectric 112 is assumed to be asingle-layer silicon dioxide film whereas dielectric 108 is an ONOstack.

To better understand how offsets in select gate 114 affect performanceof memory cell 100, example write, erase, and read operations, as theyrelate to memory cell 100, shall now be described. In order to “write” adigital bit in memory cell 100, a positive voltage on the order of 5volts, for example, is applied to region 106 while region 104 andsubstrate 102 are grounded. A low positive voltage on the order of 1.5volts, for example, is applied to select gate 114 while a higherpositive voltage on the order of 8 volts, for example, is applied tomemory gate 110. As electrons are accelerated within a channel regionbetween source and drain, some acquire sufficient energy to transportupwards and become trapped within charge-trapping dielectric 108. Thisphenomenon is known as hot electron injection, and it is an examplemechanism for storing charge within charge-trapping dielectric 108. Assuch, charges trapped within charge-trapping dielectric 108 correspondto the “high” bit state of memory cell 100. The trapped charge isretained even after the various voltage supplies are removed, hence theterm “non-volatile” attributed to memory cell 100 in the precedingparagraphs.

To “erase” memory cell 100 (i.e., in order to remove charges trapped incharge-trapping dielectric 108 due to hot electron injection) a positivevoltage on the order of 5 volts, for example, is applied to region 106while region 104 is held at a fixed bias or simply left floating, andselect gate 108 and substrate 102 are grounded. A high-magnitudenegative voltage, −8 volts for example, is applied to memory gate 110.Under these bias conditions, channel holes gain sufficient kineticenergy to overcome the oxide barrier and are injected into thecharge-trapping layer. This added positive charge compensates thetrapped negative charged electrons, thereby effectively erasing memorycell 100 to put it in the “low” bit state.

To “read” the state of memory cell 100, a low voltage applied is tomemory gate 110 and to select gate 114. The low voltage is chosen sothat it lies substantially equidistant between the threshold voltagenecessary to turn on the split-gate transistor when storing a “high” bitand the threshold voltage necessary to turn on the split-gate transistorwhen storing a “low” bit. As such, if the application of the low voltageduring the “read” operation caused substantial current flow betweenregions 104 and 106, then the memory cell holds a “low” bit. Conversely,if the application of the low voltage during the “read” operation causedno current follow between regions 104 and 106, then the memory cellholds a “high” bit.

Since the current during the “read” operation is directly proportionalto the width of the memory gate 110 and to the width 116 of select gate114, the width of each gate is a critical dimension. In other words, thewidth of memory gate 110 and the width of select gate 114 must befabricated within tight process tolerances in order to yield a gatewidth substantially equal to a nominal width set forth during the designof memory cell 100. Otherwise, if the gate widths are either too shortor too long as compared to the nominal width, incorrect operation ofmemory cell 100 will occur. Further, in an array comprising a pluralityof memory cells such as memory cell 100, each cell would have differentcharacteristics due to mismatches in select gate length. This mismatchleads to poor memory array performance. As shall be seen below, while itmay be possible to accurately control the width of memory gate 110during fabrication, controlling the width 116 of select gate 114 is morecomplicated.

FIGS. 2A-2E illustrate cross-sectional views of an example fabricationprocess for the memory cell 100 shown FIG. 1. It is to be understoodthat this description is meant to provide a general overview of themajor steps involved in fabricating a split-gate transistor and that, inactual practice, many more features and/or fabrication steps may beprovided to form memory cell 100.

FIG. 2A shows a semiconductor substrate 202 (for example silicon) havingdisposed thereon a dielectric 208 and a transistor gate layer 210.Substrate 202 may be p-type or n-type silicon as described previously.Further, substrate 202 may be a specific region of a largersemiconductor substrate (not shown). Dielectric 208 may comprise a stackof multiple dielectrics such as an ONO stack. Transistor gate layer 210may be a poly-Si film, a metal alloy, or any other material that mayserve as a transistor gate. For ease of description, it is assumed thatdielectric 208 and transistor gate layer 210 are an ONO stack and apolycrystalline film, respectively.

Dielectric 208 and transistor gate layer 210 may be deposited onsubstrate 202 by conventional deposition methods. For example, thenitride layer of the ONO stack comprised in dielectric 208 may bedeposited using low pressure chemical vapor deposition (LPCVD), whereasthe oxide layer disposed under the nitride film of the ONO stack may hegrown directly from substrate 202 using thermal oxidation; further, theoxide layer disposed over the silicon nitride film in the ONO stack mayalso be deposited using plasma-enhanced chemical vapor deposition(PECVD). Similarly, transistor gate layer 210 may be deposited via PECVDor any other methods typically used to deposit polycrystalline silicon.It shall be understood that different deposition (or growth) methods mayimpart varying electrical characteristic to memory cell 100 due tovarying film qualities.

FIG. 2B shows semiconductor device 200 having two transistor gates, anda gate dielectric disposed thereunder. While only two transistor gatesare shown in FIG. 2B, it shall be understood that more than two gatesmay be formed. The two transistor gates are formed by patterningtransistor gate layer 210. The patterning of transistor gate layer 210may be achieved by defining an etch mask (not shown) usingphotolithography and subsequently etching exposed regions of transistorgate layer 210 with an etchant that has higher selectivity to transistorgate layer 210 than to the etch mask. While this patterning step isdefined in general terms, one of skill in the art would readilyunderstand that transistor gate layer 210 may be patterned with moreadvanced lithography techniques, such as for example a double patterningstep. Following the pattering of transistor gate layer 210, exposedregions of dielectric 208 are removed. Transistor gate layer 210 therebyserves as a hard mask fur the removal of the exposed regions ofdielectric 208.

FIG. 2C shows the formation of a conformal dielectric 212 layer on andaround both gates. Dielectric 212 may be deposited utilizing adeposition process which enables step coverage. Such depositionprocesses may be, for example, PECVD. While dielectric 212 may be any ofa wide variety of commonly used dielectrics, it is assumed, for ease ofdescription, to be silicon dioxide. Dielectric 212 may be of equalthickness or thicker than dielectric 208. Dielectric 212 further extendsover the region between the formed transistor gates.

FIG. 2D shows the disposition of a spacer layer 214 on the semiconductordevice 200 of FIG. 2C. Spacer layer 214 is disposed on dielectric 212utilizing a conformal deposition process. Again, PECVD may he used todeposit spacer layer 214. For ease of description, spacer layer 214 maybe for example a poly-Si film. The deposited thickness of spacer layer214 may be, for example, less than the thickness of transistor gatelayer 210.

Following the deposition of spacer layer 214, an etch mask is disposedon spacer layer 214 and patterned (step not shown). The pattern definedin the etch mask are for forming two spacers on either side of eachgate. As shown in FIG, 2E, following the etch-back process, spacers 214a and 214 b are formed on either side of transistor gate layer 210 a and210 b. As shown in FIG. 2E, the formed spacers 214 a and 214 b have across-sectional view that comprises a perimeter having a curved portion.In some instances, the spaces sidewall may be sloped.

This sidewall shape results from increased corner erosion during theetch-back process and from the anisotropy of the dry etchants typicallyused to conduct poly-Si etching (e.g., reactive ion etching (RIE) inchloro-fluorine plasmas). Specifically, since spacer layer 214 has astep due to the elevation of transistor gate layer 210, spacer layer 214must be over-etched in order to completely remove the portion of spacerlayer 214 located directly on top of the gate. Further, since the regionof spacer layer 214 that is on the sidewall of transistor gate layer 210is conformal, the spacer resulting from the etch-back process has anoutward curved sidewall since the etchant is anisotropic.

In addition to a curved sidewall profile, the aforementioned processconditions introduce offsets in the final width of spacer 214. Forexample, variation in the duration of the etch-back process is directlyrelated to how much corner erosion occurs. As such, spacer 214 may havea width 216 that is shorter than the targeted nominal width.

FIG. 3 illustrates an example non-volatile memory cell 300, according toan embodiment of the present invention. Memory cell 300 is formed onsubstrate 302. Substrate 302 is silicon and may be a p-type silicon,bulk or a p-type region in an n-type hulk or well. Memory cell 300includes a first ti-type region 304 and a second n-type region 306. Thefirst doped region 304 may be used as a source/drain region, andsimilarly the second doped region 306 may be used as a source/drainregion. While region 304 and region 3116 are n-type in this exampleembodiment, they may also be p-type regions in another embodiment, whensubstrate 302 is an n-type bulk or an n-type well.

Memory cell 300 further includes two gates, a select gate 314, which isa spacer, and a memory gate 310. Gate 310 may be a poly-Si layerdisposed and patterned using conventional techniques. However, selectgate 314 is a spacer formed according to an example fabrication process,according to an embodiment of the present invention described below withreference to FIGS. 4A-4D,

Memory cell 300 includes at least two dielectrics. The first dielectric312 is a silicon dioxide layer. Dielectric 312 comprises a horizontalportion disposed beneath select gate 314 and a vertical portionsandwiched between memory gate 310 and select gate 314. While in thisembodiment the horizontal portion and the vertical portion of dielectric312 are assumed to be of the same material, in alternate embodiments,the two portions may be two distinct dielectric materials.

The second dielectric 308 is disposed directly beneath memory gate 310,and it is a charge trapping dielectric. Charge trapping dielectric 308may include for example a silicon nitride layer sandwiched between twosilicon dioxide layers, thus forming an ONO stack similar to the onepreviously described in memory cell 100. Alternatively, dielectric 308may include a silicon-rich nitride film, or any film that includes, butis not limited to, silicon, oxygen, or nitrogen, in variousstoichiometries.

Memory cell 300 has similar operation to memory cell 100. However,memory cell 300 differs structurally from memory cell 100 since inmemory cell 300, select gate 314 includes cross-section having 4perimeter comprising a vertical sidewall 320, substantiallyperpendicular to substrate 302, in the portion farthest away from theedge of memory gate 310. Moreover, spacer 314 includes a top curvedportion 318 shorter in length than vertical sidewall 320 so as toprovide a relatively flat surface (when compared with spacer 214) on topof spacer 314 for subsequent metallization steps. Furthermore, the topcurved portion 318 and the vertical sidewall 320 are joined at adiscontinuity 322. The discontinuity 322 is substantially shorter inlength than both the top curved portion 318 and the vertical sidewall320. The structural features of spacer 314 result from improved processcontrol of critical dimension 316, which is the width of spacer 314, andfrom minimized corner erosion during fabrication, according to anembodiment of the present invention as shall be described below.

FIGS. 4A-4D illustrate various cross-sectional views of non-volatilememory cells 400, during their fabrication on substrate 402, accordingto an embodiment. Substrate 402 is silicon and may be p-type or n-typesilicon. For example, substrate 402 may be a p-type bulk region of asilicon wafer or a p-well in an n-type region of the wafer. Similarly,substrate 402 may be an n-type bulk or an n-type well in a p-type bulkregion. While the substrate is silicon in this example embodiment,alternative embodiments may use other semiconductor substrates commonlyused in semiconductor technology. Further, while FIGS. 4A-4D depict onlytwo memory cells 400, the many fabrication steps disclosed herein applyto the fabrication of more than two memory cells 400. Furthermore, whilea plurality of steps are described, steps generally undertaken in thefabrication of semiconductor devices are omitted for the sake ofconciseness.

FIG. 4A depicts two gate structures, each gate structure comprising atransistor gate 410, a charge trapping dielectric 408, and an additionaldielectric 412 that is conformal to gate 410. The gate 410 is a poly-Silayer disposed and patterned with conventional deposition and patterningtechniques, for example. While in this embodiment gate 410 is poly-Si,in alternative embodiments gate 410 may be made using other types ofmaterial that may serve as a transistor gate. Further, in thisembodiment of the present invention, dielectric 408 may comprise a stackof multiple dielectrics such as an ONO stack, as previously described.Dielectric 412 may be silicon dioxide for example, and as in the case ofdielectric 312, it comprises a horizontal portion and a verticalportion. The horizontal portion and the vertical portion of dielectric412 are the same material in this embodiment. In alternate embodimentsthe horizontal portion and the vertical portion of dielectric 412 may bedistinct materials or distinct material stacks.

There is disposed, conformal to the gate structures, a spacer layer 414.Spacer layer 414 is poly-Si, and it may he disposed using conventionalpoly-Si deposition techniques, such as the ones mentioned above.Further, there is disposed on spacer layer 414 a thin film dielectric424. Thin film 424 is conformal to spacer layer 414. Further, thin filmdielectric 424 is substantially thinner than spacer layer 414. Thin film424 is used as a sacrificial layer. Specifically, as will becomeapparent below, thin film 424 is used to form sacrificial spacers on thesidewalls of spacer layer 414. In this example embodiment, thin film 424is silicon nitride. However, thin film 424 may be any film that has etchchemistry that is substantially different than the etch chemistry ofspacer layer 414. In other words, an etchant of thin film 424 must havevery low selectivity to spacer layer 414. Conversely, an etchant ofspacer layer 414 must have very low selectivity to thin film 424. Insummary, spacer layer 414 and thin film 424 form a multi-stack structurewherein the materials in the structure are etched at much different etchrates when subjected to an etchant that has high selectivity to only onematerial within the structure.

FIG. 4B illustrates memory cells 400 following an etch-back process forfabricating sacrificial spacers 424 a and 424 b on the sidewalls ofspacer layer 414. A mask layer is disposed on thin film 424 (not shown)and patterned. Following the patterning of the mask layer, exposedregions of thin film 424 are etched, for example, in a CF₄ or CH₂F₂plasma etchant. These etchants have high selectivity to silicon nitride,e.g., they are highly selective to thin film 424. Also, these etchantshave very low selectivity to spacer layer 414. Therefore, spacer layer414 remains substantially unaltered even when it becomes in contact withthe etchants.

FIG. 4C shows memory cells 400 following the sacrificial etch-backprocess that produced sacrificial spacers 424 a and 424 b. A subsequentetch-back process is conducted, but with an etchant having highselectivity to poly-Si, namely to the exposed regions of spacer layer414. Such etchants may be for example, chlorine and/or fluorine basedplasma etchants. These etchants have relatively low selectivity tosacrificial spacers 424 a and 424 b. Therefore, spacers 424 a and 424 bact as masks for the sidewalls of spacer layer 414 during the etch backprocess. Accordingly, there is virtually no corner erosion during theetch-back process for spacer layer 414, and the etch-back process yieldsa vertical sidewall profile. In addition, the etch-back process providesimproved control over critical dimension 416 since spacer width 416 isinsensitive to over-etching as a result of the sidewalls of spacer layer414 being protected during the process.

FIG. 4D illustrates memory cells 400 following additional stepsundertaken to remove exposed regions of dielectric 412 and to removesacrificial spacers 424 a and 424 b. These procedures yield spacers 414a and 414 b. Spacers 414 a and 414 b have a vertical sidewall 420, whichis substantially perpendicular to substrate 402, and a top curvedportion 418. The top curved portion 418 and the vertical sidewall 420are joined by a discontinuity 422 that corresponds to the width ofsacrificial spacers 424 a and 424 b. The width of discontinuity 422 issubstantially shorter than the length of vertical sidewall 420 andsubstantially shorter than the length of the top curved portion 418. Thewidth of discontinuity 422 may be minimized by keeping thin film 424 asthin as possible. Lastly, spacers 414 b and the portion of dielectric412 directly beneath them may be subsequently removed and source/drainregions may be implanted in order to yield the structure shown in theembodiment depicted in FIG. 3.

It is to be appreciated that the Detailed Description section, and notthe Summary and Abstract sections (if any), is intended to be used tointerpret the claims. The Summary and Abstract sections (if any) may setforth one or more but not all exemplary embodiments of the invention ascontemplated by the inventor(s), and thus, are not intended to limit theinvention or the appended claims in any way.

While the invention has been described herein with reference toexemplary embodiments for exemplary fields and applications, it shouldbe understood that the invention is not limited thereto. Otherembodiments and modifications thereto are possible, and are within thescope and spirit of the invention. For example, the methods disclosedherein may be used in applications where spacers are not limited tomemory-cell fabrication. Such applications may include, for example,fabrication processes that use spacers as hard masks. Furthermore, thepresent invention is not limited multi-stack material comprising siliconnitride and poly-Si. Other multi-stack materials are contemplated andare within the scope of the present invention. For example, themulti-stack may be a silicon nitride/silicon dioxide stack, a silicondioxide/poly-Si stack, and stacks of other materials typically used insemiconductor device fabrication.

The breadth and scope of the invention should not be limited by any ofthe above-described exemplary embodiments, but should be defined only inaccordance with the following claims and their equivalents.

What is claimed:
 1. A semiconductor device, comprising: a gatecomprising: a first dielectric disposed over a substrate; and a gatelayer disposed over the first dielectric; a second dielectric disposedadjacent to a first gate sidewall of the gate; and a spacer disposedadjacent to the second dielectric, wherein the spacer comprises: a firstportion disposed over the substrate, comprising: a first portionsidewall which is on the opposite side of the spacer from the seconddielectric and which is substantially perpendicular to the substrate;and a first portion top which is substantially horizontal to thesubstrate; and a second portion disposed over and in contact with thefirst portion top, comprising a second portion sidewall.
 2. Thesemiconductor device of claim 1, wherein: the first portion furthercomprises a first portion width measured between the second dielectricand the first portion sidewall at the first portion top; the secondportion further comprises a second portion width between the seconddielectric and the second portion sidewall at the first portion top; andthe second portion width is smaller than the first portion width.
 3. Thesemiconductor device of claim 1, the second portion sidewall comprisingan arc from the first portion top to the second dielectric.
 4. Thesemiconductor device of claim 1, further comprising a third dielectricdisposed over the substrate adjacent to the second dielectric whereinthe first portion is disposed over the third dielectric.
 5. Thesemiconductor device of claim 4, wherein the second dielectric and thethird dielectric comprise the same material.
 6. The semiconductor deviceof claim 1, further comprising a first doped region in the substrateadjacent to the first portion sidewall and a second doped region in thesubstrate adjacent to a second gate sidewall which is on the oppositeside of the gate from the first gate sidewall.
 7. The semiconductordevice of claim 1, wherein the first dielectric comprises a chargedielectric.
 8. The semiconductor device of claim 7, wherein the firstdielectric further comprises a nitride layer between two oxide layers.9. The semiconductor device of claim 1, wherein the :ate layer comprisespolycrystalline silicon.
 10. The semiconductor device of c aim 1,wherein the second dielectric comprises silicon dioxide.
 11. Thesemiconductor device of claim 1, wherein the spacer comprisespolycrystalline silicon.
 12. The semiconductor device of claim 1,wherein the first gate is a memory gate and the spacer is a select gate.13. An integrated circuit device, comprising: a substrate; a gatestructure having a gate conducting layer and a gate dielectric layerbetween the gate conducting layer and the substrate; a first inter-gatedielectric structure disposed adjacent to a first gate sidewall of thegate structure; a second inter-gate dielectric structure disposedadjacent to a second gate sidewall of the gate structure; a first spacerstructure disposed adjacent to the first inter-gate dielectricstructure, having a first spacer layer and a first spacer dielectriclayer between the first spacer layer and the substrate; and a secondspacer structure disposed adjacent to the second inter-gate dielectricstructure having a second spacer layer and a second spacer dielectriclayer between the second spacer layer and the substrate; wherein thefirst spacer layer and the second spacer layer each comprises: acorresponding lower spacer portion disposed over the correspondingspacer dielectric layer comprising a lower spacer portion sidewall onthe opposite side of the corresponding lower spacer portion from thecorresponding inter-gate dielectric structure, wherein the correspondinglower spacer portion sidewall is substantially perpendicular to thesubstrate, and further comprising a corresponding lower spacer portiontop surface which is substantially horizontal to the substrate; and acorresponding upper spacer portion disposed directly over thecorresponding lower spacer portion top surface comprising acorresponding upper spacer portion sidewall which comprises an arc fromthe corresponding lower spacer portion top surface to the correspondinginter-gate dielectric structure.
 14. The integrated circuit device ofclaim 13, wherein: each of the lower spacer portions further comprises acorresponding lower spacer portion width measured between thecorresponding inter-gate dielectric structure and the correspondinglower spacer portion sidewall at the corresponding lower spacer portiontop surface; each of the upper spacer portions further comprises acorresponding upper spacer portion width measured between thecorresponding inter-gate dielectric structure and the correspondingupper spacer portion sidewall at the corresponding lower spacer portiontop surface; and the corresponding upper spacer portion width is smallerthan the corresponding lower spacer portion width.
 15. The integrateddevice of claim 13, wherein the spacer dielectric layers and theinter-gate dielectric structures comprise the same material.
 16. Theintegrated device of claim 13, wherein the gate dielectric layercomprises a charge trapping dielectric.
 17. The integrated device ofclaim 16, wherein the gate dielectric layer further comprises a nitridelayer between two oxide layers.
 18. The integrated device of claim 13,wherein the gate conducting layer comprises polycrystalline silicon. 19.The integrated device of claim 13, wherein the inter-gate dielectricstructure comprise silicon dioxide.
 20. A memory integrated circuit(IC), comprising: a substrate; a memory device formed on e substrate,wherein the memory device comprises: a memory gate comprising a firstdielectric disposed over a channel region formed in the substrate and afirst gate layer disposed over the first dielectric; a second dielectricdisposed adjacent to a first memory gate sidewall of the memory gate; aselect gate adjacent to the second dielectric comprising a thirddielectric disposed over the substrate and a select gate layer disposedover the third dielectric, the select gate layer comprising a selectgate sidewall on the opposite side of the select gate layer from thesecond dielectric wherein the select gate sidewall comprises: a verticalportion which is substantially perpendicular to the substrate; and acurved portion comprising an arc from the first portion to the seconddielectric; wherein the select gate sidewall comprises a discontinuitybetween the vertical portion and the curved portion; and a first dopedregion in the substrate adjacent to the select gate and a second dopedregion in the substrate adjacent to the memory gate.
 21. The memory ICof claim 20, wherein the discontinuity is a horizontal portionsubstantially parallel to the substrate.